GB/T 44635-2024 Electrostatic discharge sensitivity testing - Transmission line pulse(TLP) - Component level
1 Scope and object
This document defines a method for pulse testing to evaluate the voltage current response of the component under test and to consider protection design parameters for electro-static discharge (ESD) human body model (HBM). This technique is known as transmission line pulse (TLP) testing.
This document establishes a methodology for both testing and reporting information associated with transmission line pulse (TLP) testing. The scope and focus of this document pertains to TLP testing techniques of semiconductor components.
This document should not become alternative method of HBM test standard such as IEC 60749-26. The purpose of the document is to establish guidelines of TLP methods that allow the extraction of HBM ESD parameters on semiconductor devices. This document provides the standard measurement and procedure for the correct extraction of HBM ESD parameters by using TLP.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1
current source method
TLP methodology (sometimes referred to as constant current method) that utilizes a 500 Ω resistor in series with the DUT and measures the voltage and current at the DUT
3.2
destructive damage
damage where the operating electrical characteristics or parameters are altered and do not recover to the initial conditions prior to stress
3.3
safe operation area; SOA
current and voltage regime where a device is in normal operation without degradation
3.4
second breakdown
condition where a negative resistance state occurs in a device due to thermal processes
Note: This is designated as the voltage trigger point V t2 and current I t2 . and is typically observed after electrical breakdown (e.g., Vt1 , It1)
3.5
thermal instability
condition whereby a device is in a negative resistance regime due to thermal processes
3.6
time domain reflectometer method; TDR
TLP methodology that uses an oscilloscope to measure both the incident and the reflected waves from the device under test (DUT)
3.7
time domain transmission method; TDT
TLP methodology that uses an oscilloscope to measure the transmitted wave after application to the device under test (DUT)
3.8
time domain transmission and reflection method; TDRT
TLP methodology that incorporates both the transmitted and reflected waves
3.9
transmission line pulse; TLP
a rectangular current pulse formed by discharging a charged transmission line cable
Note: In this document, TLP refers to any rectangular pulse formed from any pulse source.
3.10
transmission line pulse test system
a test system that applies a rectangular pulse to a device under test and allows measurement of device electrical characteristics during a pulsed state
Note: The system typically measures current and voltage across the device, as well as leakage current after TLP pulse application.
4 Test apparatus
4.1 General
Transmission line pulse (TLP) systems vary in their use of equipment, configurations, and methodology to extract the current and voltage characteristics of a device. TLP design and system configuration is contained in Annex A.
All equipment within the test system shall be able to withstand the maximum current for the largest pulse width applied. Additionally, all equipment shall withstand the maximum voltage from the initial charge voltage (including the reflected voltage) observed in the test system. Current and voltage probes shall not saturate and/or fail during TLP testing.
4.2 Oscilloscope
Oscilloscope requirements:
——minimum single shot bandwidth of at least 500 MHz.
4.3 Voltage probe
Voltage probe requirements:
——a minimum bandwidth of 200 MHz.
——shall be able to withstand a maximum voltage of twice the open-circuit maximum voltage (e.g. twice the pre-charge voltage) without electrical damage
4.4 Current probe
Current probe requirements:
——a minimum bandwidth of 1 GHz.
——shall not saturate under TLP test maximum current and/or maximum pulse width
4.5 Transmission line
Transmission line requirements:
——shall be able to withstand the maximum current for the largest TLP test pulse width without electrical damage.
——shall be able to withstand the maximum TLP test voltage observed (combined initial charge voltage and reflected voltage) without electrical damage.
